Charged particle optics, electron and ion focusing systems, and high-brightness sources are at the heart of Thermo Fisher’s Scanning Electron Microscope (SEM), Focused Ion Beam (FIB), and Dual Beam tools serving the Nanotechnology market. The FIB Group seeks an intern to assist with the development and characterization of the next generation FIB columns. Activities include one or more of the following:
Minimum Education, Experience and Qualifications:
To qualify, applicants must be legally authorized to work in the United States, and should not require, now or in the future, sponsorship for employment visa status. []
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