Job Description

Responsible for developing advanced metrology solution for CD, profile, film thickness and topography using optical interferometry, reflectometry/ellipsometry, AFM and CDSEM.   Candidate is expected to work closely with heads process development engineers to develop the new metrology solution with advanced algorithm, and to support daily metrology measurement operation for all development projects.  Candidate will be part of  a team that provide all aspects of metrology support for advanced magnetic recording heads process, and work in collaboration with the another dedicated manufacture metrology team.

Qualifications

REQUIRED

• MS/PH.D degree in one of following areas: Physics, Materials Science or other related science fields.
• At least 5 years of experiences in the metrology field to support research and development or manufacture in high tech industry or a related research environment.  Familiar with metrology technology such as optical spectroscopic technologies, AFM, FIB, SEM, TEM.
• Have good data analysis experience utilizing industry standard solutions. 
• Experience with programming language such as Python, MatLab or other high level program languages for customized metrology algorithms development.

SKILLS

• Effective communication skill in all aspects.  Proficient in English in speaking, and writing.
• Must be a team player.

Additional Information

All your information will be kept confidential according to EEO guidelines.